A re-emitted positron energy spectrometerGOODYEAR, A; COLEMAN, P. G.Measurement science & technology (Print). 1995, Vol 6, Num 4, pp 415-421, issn 0957-0233Article

Savitzky and Golay differentiation in AESGILMORE, I. S; SEAH, M. P.Applied surface science. 1996, Vol 93, Num 3, pp 273-280, issn 0169-4332Article

Atomic ratios determined by EELS under parallel and convergent illumination conditionsSU, D. S; WANG, H. F.Ultramicroscopy. 1995, Vol 57, Num 4, pp 323-325, issn 0304-3991Article

The development of Auger spectroscopy as a probe of local electronic structureWEIGHTMAN, P.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 3, pp 263-288, issn 1154-2799Article

Development of the EXELFS technique for high accuracy structural informationQIAN, M; SARIKAYA, M; STERN, E. A et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 137-147, issn 0304-3991Conference Paper

Intercomparison of algorithms for background correction in XPSJANSSON, C; TOUGAARD, S; ANDERSON, C. A et al.Surface and interface analysis. 1995, Vol 23, Num 7-8, pp 484-494, issn 0142-2421Article

A new apparatus for impact collision ion scattering spectroscopyKAWAMOTO, K; INARI, K; MORI, T et al.Japanese journal of applied physics. 1995, Vol 34, Num 9A, pp 4917-4919, issn 0021-4922, 1Article

Enhanced resolution of depth profiles using two-dimensional XPS dataAMINOV, K. L; JORGENSEN, J. S; BOIDEN PEDERSEN, J et al.Surface and interface analysis. 1996, Vol 24, Num 1, pp 23-27, issn 0142-2421Article

Sources of internal scattering of electrons in a cylindrical mirror analysis (CMA)EL GOMATI, M. M; EL BAKUSH, T. A.Surface and interface analysis. 1996, Vol 24, Num 3, pp 152-162, issn 0142-2421Article

Delocalization in inelastic scatteringMULLER, D. A; SILCOX, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 195-213, issn 0304-3991Conference Paper

Measurement of TEM primary energy with an electron energy-loss spectrometerMEYER, C. E; BOOTHROYD, C. B; GUBBENS, A. J et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 283-285, issn 0304-3991Conference Paper

Theory of scanning tunneling spectroscopy based on the resonant tunneling model II : relation between different appraochesMAKOSHI, K; MII, T.Japanese journal of applied physics. 1995, Vol 34, Num 6B, pp 3325-3328, issn 0021-4922, 1Conference Paper

Cryo-electron energy loss spectroscpy: observations on vitrified hydrated specimens and radiation damageLEAPMAN, R. D; SUN, S.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 71-79, issn 0304-3991Conference Paper

High-performance current-voltage measurement system for scanning tunneling spectroscopy of deposited moleculesOKUMURA, A; NAKAGAWA, H; MIYAMURA, K et al.Japanese journal of applied physics. 1995, Vol 34, Num 4A, pp 2055-2056, issn 0021-4922, 1Article

Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods availableBOTTON, G. A; BOOTHROYD, C. B; STOBBS, W. M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 93-107, issn 0304-3991Conference Paper

Analyzing line scan EELS data with neural pattern recognitionGATTS, C; DUSCHER, G; MÜLLEJANS, H et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 229-239, issn 0304-3991Conference Paper

Recent studies of near-edge structureBROWN, L. M; WALSH, C. A; DRAY, A et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 121-125, issn 1154-2799Conference Paper

Determination of the spectrometer transmission function of XPS quantitative analysisZOMMER, L.Vacuum. 1995, Vol 46, Num 5-6, pp 617-620, issn 0042-207XConference Paper

Interactive image-spectrum EELS: application to elemental mapping of lubricant colloidsMARTIN, J.-M; LAVERGNE, J.-L; VACHER, B et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 53-63, issn 1154-2799Conference Paper

Problems of tunneling spectroscopy at oxide covered TiKOBUSCH, C; SCHULTZE, J. W.Electrochimica acta. 1995, Vol 40, Num 10, pp 1395-1399, issn 0013-4686Conference Paper

The role of the Auger mechanism in the radiation damage of insulatorsCAZAUX, J.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 3, pp 345-362, issn 1154-2799Article

Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy-dispersive X-ray microanalysisOLESHKO, V; GIJBELS, R; JACOB, W et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 79-88, issn 1154-2799Conference Paper

New electrostatic cylindrical energy analyzerILYIN, A. M; ILYINA, I. A.Optik (Stuttgart). 2007, Vol 118, Num 7, pp 350-352, issn 0030-4026, 3 p.Article

Development of a novel tool for semiconductor process controlGWILLIAM, R. M; KNIGHTS, A. P; WENDLER, E et al.Materials science & engineering. B, Solid-state materials for advanced technology. 2001, Vol 80, Num 1-3, pp 60-64, issn 0921-5107Conference Paper

EDS and EELS using a TEM-FEG microscopeSTADELMANN, P; LEIFER, K; VERDON, C et al.Ultramicroscopy. 1995, Vol 58, Num 1, pp 35-41, issn 0304-3991Conference Paper